Scanning probe microscopy (SPM) is widely recognized as one of the most important techniques for surface measurements with nanoscale accuracy.
Magnetic force microscopy (MFM) is a specific SPM mode allowing for the acquisition of information about magnetization distributions with high resolution.
|Organization||University of London|
|Subject areas||Physics, Microscopy|
|Eligibility||Degree in Relevant Subject|
|Deadline||30 March 2016|
- Magnetic imaging and determination of the domain structure
- Development and implementation of advanced microscopic methods
- Development of the approach for quantitative analysis of MFM images
- Design and fabrication of magnetic nanodevices and custom-made probes
- Measurement of magnetotransport properties of nanodevices.
Skills to develop:
- Basic (AFM, MFM, EFM) and advanced (SGM, SKPM, sSNOM) SPM techniques.
- Nanofabrication techniques (thin film deposition, lithography, FIB, etc.).
- Transport and noise measurements in nanodevices (LabView modelling, transport measurement setup, spectrum analyser, etc.).
- Advance transport measurements (4-probe STM, including Cryogenic, high magnetic field operation).
- Physical modelling (MATLAB, COMSOL).
How to apply
Royal Holloway, University of London
T: +44 (0)1784 434455
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